As part of the NanoMend project IBS Precision Engineering, The Centre for Process Innovation (CPI) and the University of Huddersfield are collaborating in the development of a new optical interferometry system for fast surface measurement of low contrast defects over large, industrially–compatible substrate areas. Defects present in thin films, such as vapor barrier layers, have contrasts too low to be picked-out by the machine vision camera systems conventionally used for defect detection. T...